2008 International Conference on Control. Hardware-in-the-loop test for fault diagnosis system of. Memory BuiltMemory Built-In SelfIn Self-Repair. BIST Built-In Self-Test Test BISD Built-In Self-Diagnosis Fault Location. A Programmable Built-In Self-Diagnosis for Embedded SRAM. The fault diagnosis system developed is aimed to. In BIST Program mode the test code is loaded in. Board-Level Fault Diagnosis using Bayesian Inference. Test and diagnosis strategies vary depending on the assembly. Robust Fault Detection for VLIW Processors Using Software Based Self Testing . You can download the paper by clicking the button above. The fault diagnosis based on the compressed responses from BIST was called the post-BIST fault diagnosis.
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January 2017
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